Prof. Peter Jacob

Honorary Professor at TUM since 2007


Scanning Electron Microscopy


After completing his studies in technical physics, Professor Jacob specialized in the failure analysis of electronic components, in particular of semiconductors. His major areas of interest were specific methods and equipment technologies, failure mechanisms, and root causes in the production and in applications. Many of his publications and technical papers also deal with the electrostatic mechanisms (e.g. ESD) within robotic process machines that cause electrical failure.

For many years Professor Jacob has been involved in both academic research and industrial practice. His current research focus is on system-level failure mechanisms, electrostatic charging in robotic process equipment and the appropriate countermeasures, and the reliability of optoelectronic components, especially LEDs. His work in industrial practice focuses on the failure analysis of LP CMOS components and power semiconductor components (thyristors and IGBT modules). In 1992, when he was working for Hitachi, Professor Jacob offered a course of studies at TUM on scanning electron microscopy. The course was so popular that it is now held every year and is offered in short-course mode involving blocks of lectures and SEM on-site training sessions.


  • Failure analysis and ESD consultant, RoodMicrotec Stuttgart (since 2008)
  • Principal engineer failure analysis, EM Microelectronic Marin SA (since 1995)
  • Principal engineer microelectronics/ Microstructural Devices, EMPA Dübendorf (since 1993)
  • Application engineering/SEM configuration/sales support, Hitachi Scientific Instruments, Ratingen (1992-1993)
  • Responsible for setting up a semiconductor products failure analysis facility, IBM Deutschland GmbH, Böblingen (1981-1992)


  • ISTFA Outstanding Poster Award (2011)
  • International Dresden Barkhausen Award (2010)
  • ESREF Best Paper Award (2008)
  • Lillehammer Award (team award) (2002)
  • Recipient of the special prize donated by the President of Germany for a particularly distinguished project in the German youth science competition “Jugend forscht” (1975)